CMI7600 pages

CMI760 Series ®

760

Highly flexible equipment for copper measurement

The Oxford Instruments CMI760 was designed to
meet the copper measurement and quality control
needs of the printed circuit board industry
The CMI760 measures various surface copper
applications and comes with a SRP-4 userreplaceable tip. Optional accessories that
measure plated through-hole copper can also
be added. This highly expandable benchtop
system is capable of both micro resistance and
Eddy Current testing, resulting in accurate and
precise measurement of copper.
This benchtop system is remarkably versatile and expandable. The
CMI760 accepts multiple probe types to meet application
needs, including surface copper, through-hole, micro
through-hole, and through-hole quality.
The CMI760 product comes standard with an advanced statistical
package for the interpretation of test data. We stand behind our
equipment with a responsive customer service team and warranty
policy. SRP-4 PROBE: The SRP Probe utilizes advanced micro
resistance test method technology. This probe measures thickness
as a function of resistance, therein obtaining exact, reliable
readings regardless of laminate thickness and/or copper plating on
the opposite side of the printed circuit board. The SRP-4 features
user-replaceable probe tips. A worn probe tip can be quickly
and easily replaced on-site, minimising downtime. Replacement
probe tips are a far more economical alternative to replacing the
entire probe. One replacement probe tip comes standard with
the CMI760. Additional probe tips are available in boxes of three.
Additionally, this tethered probe features a rugged cable and small
footprint for ease of use.

CMI760 product consists of
(for surface copper applications):

• tGauge: CMI760
• tSRP-4 Probe
• tOne SRP-4 Replacement Probe Tip
• tTwo NIST Traceable Calibration Standards
• tOptional Standards available for a range of copper weight
Optional accessories
(for plated through-hole applications):

• tETP Probe
• Plated through-hole standard