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LSM 3500 pages
Datasheet
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LSM 350
4-quadrant Source and Measure Unit
for LED Production Tests
Product highlights
t Very short test cycles and
t parallel electrical measuretments
t 0 – 350 mA; 0 – 8 V
t Up to 4 test channels with
t optional switch matrix
t Dedicated test channel for
t μA range
t Measurement of breakdown
t voltage up to 40 V
The LSM 350 source and measure unit was specifically developed to meet
the requirements for production testing of LEDs and LED wafers. High test
speeds and tailor-made functions make this unit an attractive solution for
supplying current or voltage to LEDs with low to medium power output.
Up to four test channels can be provided for multi-chip LEDs (e.g. RGB or
RGBW). Combination with high-precision array spectrometers from Instrument Systems creates a test system that meets the highest requirements
for optical and electrical testing carried out on LEDs.
As a bipolar current and voltage source, the LSM 350 provides all the functions necessary for testing LEDs fast. The automatic polarity test feature
can be used for single and multi-chip LEDs. Dedicated test channels permit particularly precise measurements at low forward currents of 1 μA, and
measurement of reverse currents in the nA range. The basic module can be
expanded by an option to measure breakdown voltages up to 40 V. Top priority was given to short settling times when the unit was being developed.
As a result, test cycles are up to 40% below those of most standard current
sources. The LED 350 is fully integrated in the LED Tester software from
Instrument Systems, allowing test routines to be set up quickly and effortlessly with binning specifications and statistical analyses.
light measurement
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