Boundary Scan - Basics and Applications0 pages
Boundary Scan
Basics and Applications
t Technology for signal access without nails and probes
t Automated test generation and pin-failure diagnosis
t Debug of BGA pins and embedded nets
t In-system programming of Flash and PLDs
t Tool suite completely integrated in SYSTEM CASCON™
Boundary Scan (IEEE Std. 1149.x) is a revolutionary technology substituting the
physical access via nails and probes by means of special on-chip electronics (electronic
nails) in conjunction with a dedicated four-wire bus. The method was developed as
successor of the digital In-Circuit Test (ICT). It implements the tester’s pin electronics
directly in the IC design. Boundary Scan provides a multitude of opportunities for
structural or functional tests and hardware debug as well as in-system programming.
Utilizing the integrated software platform SYSTEM CASCON™, users can implement
the full potential of all strategies comprehensively and very flexibly throughout entire
product life cycle.
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