Product information MultiSpec® CCD0 pages

Systems

Product Information MultiSpec® CCD

MultiSpec® CCD: UV-VIS-NIR Detector Array Spectrometer System

MultiSpec 
CCD is part of the modular MultiSpec
instrument family of fast simultaneous readout spectrometer systems. Based on flexible
19“ chassis technology, it is the perfect tool for
process applications. The integrated spectrometers are high-sensitive modules without moving

parts and with outstanding long-term stability. The
detector array design allows acquisition of whole
spectra in milliseconds. Multiplexing technology
offers multichannel operation. The standardized
SMA connectors on the front allow easy coupling
of fiber optics with all types of probes and cells.

Features
❚t Suitable for detection of low light levels
❚t UV-sensitive back thinned CCD technology
❚t Available spectral range: 200 – 980 nm

❚t High dynamic range of 16 Bits
❚t Fast, precise, robust
❚t Versatile software packages

MultiSpec UV-VIS-NIR
Carl Zeiss Spectrometer Modules
The MultiSpec system is based on the quasi-monolithic
MCS

CCD

spectrometer

modules

from

Carl

Zeiss.

The high sensitivity and the extreme stability of these modules combined with tec5 16 Bit electronics a allow for very
reproducible and accurate measurements with a large
dynamic range.
Plug-In Cassette Design
MultiSpec systems follow a modular concept. All the components, such as spectrometers or light sources, are integrated
into cassettes, which can be changed easily.
Process Communication
Advantages

The MultiSpec systems can be equipped with an OPC inter-

The back-thinned / back-illuminated CCD technology

face or various add-on I/O-boards (4-20mA, digital I/Os,

combines

spectral

Profibus) for process communication to transfer results and

range from UV to NIR with the large dynamic range of a

high

sensitivity

over

the

whole

status information (e.g. system error, system warning, out-

classical photo-diode detector array. These CCDs are

of-range signal) to a process control system. Additionally,

especially suitable for low light level detection like fluores-

a remote control from an SPS or PLS is available to trigger

cence, film thickness, plasma or diffuse reflection meas-

for maintenance measurement cycles or to stop continuous

urements. Due to the capability to detect small amounts

data aquisition.

of light, short exposure times are possible for high
speed process control.