Wafercheck 1500 pages

WaferCheck 150
PICOQUANT

Semiconductor Wafer Analyzer
Excitation with diode laser pulses as short as 50 ps (FWHM)
Excitation wavelengths: 375 to 810 nm
Emission wavelength selection with easily exchangeable filters
Detector options: PMT or MCP-PMT
Data acquisition based on Time-Correlated Single Photon Counting
Integrated laser power meter

4

10

3

10

2

10

intensity [counts]

10

1

4

8

12

16

20
time [ns]

24

28

32

36

40

Applications
Monitoring Time-Resolved Photoluminescence (TRPL) from semiconductors
Online semiconductor process analysis and quality control
Time response characterization of optoelectronic devices
Specifically designed for GaAs/GaN wafers (e.g. solar cells)
Photovoltaic
LEDs, OLEDs