Nanosurf Flex-ANA0 pages

Flex-ANA: Automated Nanomechanical Analysis
Based on the popular Nanosurf FlexAFM, this fully automated
system was developed specifically for the nanomechanical
analysis of large, uneven, or rough surfaces. A 100 µm Z-stage with
position sensor is integrated into to the large range automated
translation stage to allow highly accurate force measurements.
System features
Fully integrated, automated atomic force microscope with
user-friendly touchscreen software interface
A unique proprietary algorithm that conforms to sample
surface undulations outside of the AFM’s Z-range during
measurements
Large X-, Y-, and Z-range to accommodate varying sample
dimensions
Real-time automated evaluation and analysis of data
Applications
Force mapping and automated material hardness, elasticity, and
adhesion measurements/calculations on rubber, plastics, soft
coatings, block-copolymers, tissue samples, cell matrix, tissue
scaffolds, and many other irregular materials.

Typical Setup. Digital cameras, a video and afm parking
station, active vibration isolation, and an acoustic
enclosure are all included with the system.

Automated stage specifications
Description

Specification

Range (X / Y / Z / δz)
Positioning accuracy (X / Y / Z / δz)
Sample Platform Size (X / Y)

32 / 32 / 5 / 0.1mm
<1 / <1 / <1 / <0.001 µm
35 / 35 mm

AFM specifications
Description

Specification

Scan range (XY)

100 µm

Height range (Z)

User interface. Touchscreen spot selection.

10 µm
(Additional 100 µm through δz
option of the automated stage)

XY Linearity mean error
XY flatness at maximum range
Z noise level (RMS dynamic mode in air):

< 0.1%
Typ. 5 nm
Typ. 30 pm in appropriate environment

Reference
Plodinec et al. 2012, Nature Nanotechnology 7, 757–765.

Real-time data acquisition and analysis.

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www.nanosurf.com

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